摘要
精确测量了电路中各个元件的参数,为各种混沌现象的定量分析和数值模拟提供了可能;提出了一种新的测量非线性负阻方法,能精确而快捷地测量非线性负阻完整的I-U曲线;利用这种测量方法的实验电路,可以直接演示电路出现各种混沌现象时非线性负阻对应的工作区段,展示了非线性负阻在蔡氏电路产生混沌过程中所起的决定性作用,有利于学生更好地理解混沌现象产生的机理.
Parameters of elements in the nonlinear circuit are measured precisely. A novel approach is proposed for a precise and convenient characterization of the nonlinear negative resistor. Based on this improved approach, it is possible to demonstrate simultaneously the chaos states of the circuit and their related I-U working regions of the nonlinear negative resistor, which is very helpful for a better understanding of the origin of nonlinear phenomera in the Chua' s circuit.
出处
《大学物理》
北大核心
2010年第6期53-57,65,共6页
College Physics
基金
国家基础科学人才培养基金项目(J0730310)资助
关键词
蔡氏电路
负阻测量新方法
混沌现象演示
负阻状态与混沌现象的关联
Chua' s circuit
novel approach for characterizing the negative resistor
chaos demonstration
relations between the state of negative resistor and the nonlinear phenomena