铅对大鼠不同脑区IEG表达的影响

Effect of lead on the expression of immediate early genes in different regions of rat brain

为了研究即刻早期基因（ＩＥＧ）在铅的神经毒性机制中的作用，本实验应用ＦＯＳ和ＪＵＮ蛋白免疫组织化学方法对腹腔注射染铅１３ｍｇ／ｋｇ及１３０ｍｇ／ｋｇ的大鼠不同脑区ｃ－ｆｏｓ、ｃ－ｊｕｎ表达水平进行了观察。图像分析及统计检验结果表明，急性染铅２小时后，大鼠脑组织皮层、海马ＣＡ３区及小脑的ｃ－ｆｏｓ、ｃ－ｊｕｎ表达的阳性面积比［Ａａ（％）］、平均灰度或阳性细胞个数等参数与对照组相比有显著性差异（Ｐ＜０．０５），即染铅组ＩＥＧ表达高于对照组。这一结果提示第三信使ＩＥＧ作为转录调控因子可能参与了铅对学习记忆损害的神经毒性过程。这对深入阐明铅神经毒性的分子机制提供了一定的实验依据。

In order to study the role of immediate early genes (IEG) in the neurotoxic mechanism of lead, expression of c fos and c jun genes in different regions of rat brain treated with lead (13 and 130 mg/kg) were observed by using immuno histochemical method. The observation and image analysis showed that after rats treated by lead for 2 hours, the c fos and c jun expression in cortex, CA 3 area of hippocampus and cerebellum of rats were higher than those of control rats significantly ( P <0 05). The results indicated that IEG, as a transcription regular factor, may participate in the neurological toxicity damaging the learning and memory ability induced by lead. The study provided experimental basis for revealing the molecular neurotoxic mechanism of lead.