基于BIT的PXI总线导弹测试系统设计

Design on Missile Testing Systems in PXI Buses Based on BIT

BIT和ATE已成为提高复杂系统测试性、维修性的有效途径;PXI总线被广泛地应用于自动化测试领域;在资源配置、模块设计、系统设计、兼容性设计、容差设计等方面的分析基础上,该论文提出了一般性BIT和ATE设计的原则;对导弹测试发射控制系统基于BIT和ATE的PXI总线一体化设计进行了研究,给出了系统级测试结构图和电路板级测试结构图,以及软件的总体设计;该技术的应用将进一步推动导弹测试发射控制系统的智能化、通用化和小型化,从而提高导弹的整体性能。

Progressively, Built--In Test （BIT） and Automatic Test Equipment （ATE） becomes the effective approach to improve complex system testability and maintainability. Widely, PXI （PCI extensions for Instrumentation） is applied to the domain of automated test. Based on analysis of the configuration of resource, module design, system design, compatibility design, tolerated error design, and so on, this paper presented the method of disigning the BIT and ATE. This paper researched the test launch and control system for launch missiles, incorporating design in PXI bus based BIT and ATE. It presented the system level test structure figure, the circuit board level test structure figure and the flow chart of software. The application of technology promotes the intelligentizing, generalizing and miniaturizing of the test launch and control system for launch missiles so as to improve the whole performance of missiles.