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Influence of laser conditioning on defects of HfO_2 monolayer films

Influence of laser conditioning on defects of HfO_2 monolayer films
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摘要 The influence of laser conditioning on defects of HfO2 monolayer films prepared by electron beam evaporation (EBE) is investigated utilizing the spot-size effect of the laser-induced damage.It is found that the laser-induced damage threshold of HfO2 monolayer films can be increased by a factor of 1.3-1.6.It is also found that the defects with low threshold can be removed by laser conditioning and defects with higher threshold may be removed partially. The influence of laser conditioning on defects of HfO2 monolayer films prepared by electron beam evaporation (EBE) is investigated utilizing the spot-size effect of the laser-induced damage.It is found that the laser-induced damage threshold of HfO2 monolayer films can be increased by a factor of 1.3-1.6.It is also found that the defects with low threshold can be removed by laser conditioning and defects with higher threshold may be removed partially.
出处 《Chinese Optics Letters》 SCIE EI CAS CSCD 2010年第6期615-617,共3页 中国光学快报(英文版)
关键词 Electron beams Hafnium compounds Laser damage Magnetic films Monolayers Electron beams   Hafnium compounds   Laser damage   Magnetic films   Monolayers
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