摘要
数字射线技术正获得越来越广泛的应用,并成为射线检测技术的发展趋势。但目前有关数字射线技术的标准对于图像质量控制方面的规定还相对简单,难于进行有效的质量控制,因而在实际检测中可能出现较大的随意性而影响检测结果评判。使用互补金属氧化物半导体(CMOS)线阵列射线探测器与阶梯试块进行射线检测实验,得到了不同厚度所对应的灰度图像,测试了影像对比度,同时分析了图像的信噪比和检测灵敏度。通过对实验结果的综合对比分析,提出了数字化射线检测图像质量控制措施。
Digital radiography (DR) is used more and more in practice, and it is becoming the development trend of radiographic testing. But the standards about digital radiography are brief on the control of image quality, so the digital images are easily to be degenerated by random factors, thus the accuracy of results is likely to be affected. Digital radiography system with Complementary Metal-Oxide-Semiconductor Transistor (CMOS) linear array detector was used to test a specimen, which has 8 different steps. Then the image quality was evaluated, the contrast, SNR(Signal Noise Ratio) and Image Quality Indicator (IQI) sensitivity of different images were comprehensively analyzed. Finally, how to properly control the image quality was discussed.
出处
《CT理论与应用研究(中英文)》
2010年第2期61-68,共8页
Computerized Tomography Theory and Applications
基金
中国工程物理研究院国防预研项目(K606-09-Y)