高纯石墨中杂质成分的检测研究

Study on Detection of Impurity Composition in High-purity Graphite

高纯石墨中杂质含量极低,通过常规的检测方法很难检测到杂质的存在,而且无法准确检测出杂质含量。根据高纯石墨中杂质的性质,提出了一种高纯石墨杂质成分的富集方法。通过对富集灰分进行检测分析可知,高纯石墨主要杂质成分为Si、Al,还有少量Fe、Ca、Mg,其中Si的含量最高,提高Si的去除效率是改善提纯效果的关键。

The impurity content in high-purity graphite was extremely low,so it is very difficult to detect the existence of impurities,and the impurity content also can not be accurately detected.According to the properties of impurities in high-purity graphite,a method to enrich the impurities in high-purity graphite was put forward.After detection and analysis of enriched ash,it is found that the impurity in high-purity graphite was mostly composed of Si and Al,besides a trace of Fe,Ca and Mg,with the content of Si being the highest.How to increase Si removal efficiency is the key for improving purification effect.