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相关向量机模型及其在T^2控制图异常识别中的应用 被引量:3

On Fault Identification of Mean Shifts in T^2 Control Chart Using Relevance Vector Machines
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摘要 研究了关联向量机(Relevance Vector Machine)的基本原理及其训练方法,针对T2控制图的诊断问题,在假设过程协方差矩阵保持不变的前提下,建立了一种基于RVM的T2控制图均值偏移模型,该模型单独对过程各变量进行均值偏移诊断,并能指出均值偏移的方向。以一个三维过程为例,根据不同的均值偏移模型,产生SVM训练样本和测试样本。仿真分析结果表明,文章构建的模型对不同均值偏移模式下的测试数据的分类正确率均超过70%,大部分情况下超过80%。 The theory of Relevance Vector Machine(RVM) and its training method are studied.Based on a brief of introduction of T2 control chart,a RVM-based T2 control chart model is proposed under the assumption of constant variance-covariance matrix.In the model,the process variables are analyzed independently with RVM and it can give the directions of means shifts.A simulation with an three dimensional example.It shows in the simulations that the proposed model can give comparatively accurate diagnosis results.In the testing process,the correct classification ratios of different means shifts combinations are all over 70% and a large proportion of them are bigger than 80%.
出处 《组合机床与自动化加工技术》 北大核心 2010年第6期97-100,共4页 Modular Machine Tool & Automatic Manufacturing Technique
关键词 多元统计过程控制 均值偏移诊断 支持向量机 仿真 relevance vector machine T2 control chart mean shift diagnosis simulation
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参考文献14

  • 1Niaki,S.T.A.and B.Abbasi,Fault diagnosis in multivariate control charts using artificial neural networks[J].Qual.Reliab.Engng.Int.,2005,21:825-840.
  • 2Hotelling,H.,Multivariate quality control,in Techniques of statistical analysis[M].1947,McGraw-Hill:New York.
  • 3Bersimis,S.,Psaarakis,S.and Panaretos J.,Multivariate statistical process control charts:an overview[J].Quality and Reliability Engineering International,2007,23:517-543.
  • 4Guh,R.S.,On-line identification and quantification of Mean shifts in Bivariate Processes using a neural network-based Approach[J].Quality and Reliability Engineering International,2007,23:367-385.
  • 5Wang,T.Y.and Chen L.H.,Mean shifts detection and classification in multivariate process:a neural-fuzzy approach[J].Journal of Intelligent Manufacturing,2002,13:211-221.
  • 6Hou,T.H.,Liu,W.L.and LIN,L.Intelligent remote monitoring and diagnosis of manufacturing processes using an integrated approach of neural networks and rough sets[J] ,Journal of Intelligent Manufacturing,2003,14:239-253.
  • 7Yu,J.b.,Xi,L.F.and Zhou,X.,Intelligent monitoring and diagnosis of manufacturing processes using an integrated approach of KBANN and GA[J] ,Computer in Industry,2008,59:489-501.
  • 8Yu,J.B.and Xi,L.F.,A neural network ensemble-based model for on-line monitoring and diagnosis of out-of-control signals in multivariate manufacturing processes[J] ,Experts Systems with applications,2009,36(1):909-921.
  • 9Venkat Venkatasubramanian,R.R.,Surya N Kavuri,Kewen Yin,A review of process fault detection and diagnosis Part Ⅲ:process history based methods[J] ,Computers and Chemical Engineering,2003,27:327-346.
  • 10Tipping,M.E.Sparse Bayesian Learning and the Relevance Vector Machine.Journal of Machine Learning Research,2001(1):211-244.

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