期刊文献+

喷丸致材料晶粒细化的实验研究

Experimental Investigation on Grain Refinement of Copper due to Shot Peening
下载PDF
导出
摘要 喷丸是通过剧烈塑性变形使材料细化同时硬度得以提高的方法之一。用纯铜作为实验材料在高能气动喷丸实验机上进行实验,利用显微硬度仪以及电子背散射衍射方法对经喷丸处理的试样进行硬度及晶粒尺寸测量。结果表明:当处理时间为1333.3S时,平均晶粒尺寸由原始的25.48μm细化至2.52μm,且显微硬度由原来的0.58GPa增加到1.25GPa。实验结果验证了该方法的有效性。 SP is a typical severe plastic deformation method not only to produce ultra - fine grains of metallic materials, but also to increase the hardness. An experimental investigation was carried out on pure copper specimens by means of a shot peening machine driven by high energy air pressure. A micro -hardness indenter, an optical microscope and a scanning electron microscope equipped with electrical back scatter diffraction apparatus were also utilized in this experimental investigation. The results show that the mean grain size in the specimens with 1 333.3 s is 2.52 microns compared with the original value of 25.48 microns. The micro - hardness testing on the specimens shows the hardness increased from O. 58GPa to 1.25 GPa after SP treatment.
出处 《军事交通学院学报》 2010年第4期80-83,共4页 Journal of Military Transportation University
关键词 喷丸 量纲分析 纯铜 平均晶粒尺寸 显微硬度 SP(shot peening) dimensional analysis copper mean grain size micro-hardness
  • 相关文献

参考文献6

  • 1Gleiter H, Nanostructured materials: basic concepts and microstructure[ J]. Acta Materialia, 2000, 48 ( 1 ) : 1 - 29.
  • 2Suryanarayana C, Koch C C, Nanocrystlline materials - Current research and future directions[J]. Hyperfine Interactions, 2000, 130(1):5-44.
  • 3Valiev R Z, lslamgliev R K, Alexandrov I V. Bulk nanostructured materials from severe plastic deformation [J]. Progress in Materials Science, 2000,45 ( 2 ) : 103 - 189.
  • 4Wang Y M, Ma E, Three strategies to achieve uniform tensile deformation in a nanostructured metal[J]. Acta Materialia, 2004, 52(6) : 1699 -1709.
  • 5Humphrerys F J. Review grain and subgrain characterization by electron backscatter diffraction [ J ]. Journal of Materials Science, 2001, 36(16): 3833-3854.
  • 6Humphrerys F J. Characterization of fine - scale microstructures by electron backscatter diffraction (EBSD) [ J]. Seripta Materialia, 2004, 51 (8) : 771 -776.

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部