期刊文献+

MOSFET击穿特性的二维数值模拟

下载PDF
导出
摘要 0引言 MOSET中产生击穿的机构有漏源击穿和栅绝缘层击穿。其中漏源击穿电压是由漏一衬底的PN结雪崩击穿电压与穿通电压两者中的较小者决定的。本文对漏源击穿运用MEDICI二维器件模拟软件进行分析。
出处 《数字通信》 2010年第3期80-82,88,共4页 Digital Communications and Networks
  • 相关文献

参考文献3

  • 1USER'S M. Two-Dimensional Device Simulation Program [ EB/OL ]. ( 1985-05-21 ) [ 2009-09-12 ]. http://portal. acre. org/citation, cfm? id = 102095.
  • 2郭红霞,陈雨生,周辉,张义门,龚仁喜,吕红亮.MEDICI程序简介及其在电离辐照效应研究中的应用[J].计算物理,2003,20(4):372-376. 被引量:3
  • 3施敏,黄振岗. 半导体器件物理[M]. 北京:电子工业出版社, 1987.(Sh i M, Huang Z G. Physics of semiconductor devices. Beijing:Electronic Industry Press, 1987)

二级参考文献9

  • 1User's Manual, MEDICI: Two-Dimensional Device Simulation Program [ Z], 1998.
  • 2Mcwhorter P J, Winokur P S. Donor/Acceptor nature of radi-ation-induced interface traps [ J]. IEEE Trans Nuc Sci,1988,35: 1154.
  • 3Saks N S, Brown D B. Interface trap formation via the twostage H^+ process [J] .IEEE Trans Nuc Sci,1989,6:1848.
  • 4Mclean F B, Boesch H E. Time-dependent degradation of MOSFET channel mobility following pulsed irradiation [ J ].IEEE Trans Nuc Sci, 1989 ,NS - 36(6)6:1772.
  • 5Stahlbush R E, Mrstik B J. Post-irradiation behavior of the interface state density and the trapped positive charge [ J ].IEEE Trans Nuc Sci, 1990,37:1641.
  • 6Ma T P. Ionizing radiation effects in MOS devices and circuits [ M ]. Printed in the United States of America, 1989.151 - 157.
  • 7Wirth J I, Rogers S C. Transient response of transistors and diodes to ionizing radiation [J]. IEEE Trans Nuc Sci, 1964,NS - 11:24.
  • 8Bertil Sigfridsson. Transient radiation effects in CMOS structures related to geometrical dimensions and nuclear radiation pulse forms [ J ] IEEE Trans Nuc Sci, 1990, NS - 37 : 1744.
  • 9Edward W Enlow. Photocurrent modeling of modem microcircuit PN junctions [ J ]. IEEE Trans Nuc Sci, 1988, NS -35 : 1467.

共引文献11

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部