碲铟汞晶体的透射电子显微分析

TEM Analysis on Hg_3In_2Te_6 Crystal

采用垂直布里奇曼法,生长出直径为30mm的Hg3In2Te6晶体。通过透射电子显微镜观察Hg3In2Te6晶体和第二相粒子的形貌,并利用选区电子衍射技术分析其物相。结果表明:晶锭基体的物相为Hg0.5In0.33Te;同时观察到了HgTe、In2Te3等第二相,尺寸为10～40nm。推测晶体发生分解是形成第二相的原因。

Hg3In2Te6 crystal with diameter of 30 mm had been grown by vertical Bridgman （VB） method.The second-phase particle in Hg3In2Te6 crystals had been investigated by transmission electron microscopy （TEM）.The selected area electron diffraction had been carried out with a view to analyze their phases.The experimental results show that the phase of ingot is Hg0.5In0.33Te.The phases HgTe and In2Te3 with the size 10-40 nm have been found in Hg3In2Te6 crystal,which is likely to be formed by the decomposition of Hg3In2Te6.