摘要
使用迈克耳孙干涉仪测量较厚介质板的折射率时,发现迈克耳孙干涉仪中放入待测介质板后,反射镜M1的调节方向异常.针对这一实验现象,从理论上进行分析,解释了实验中出现的异常现象,并推导出反射镜M1在两次观测中移动的距离与介质板折射率的关系式.实验结果进一步证明理论与公式的正确性.
The method for measuring the refractive index of thick medium plate is studied by means of Michelson interferometer. It is observed that the adjustment direction of reflector （M1） is abnormal when the medium plate is inserted. This phenomena is explained theoretically. A new formula about the relation between the moving distance of reflector （M1） in twice observations and the refractive index of the medium plate is derived. The validity of the formula is further proved by the experimental results.
出处
《物理实验》
北大核心
2010年第6期28-31,共4页
Physics Experimentation
基金
三明学院服务海西建设重点工程项目(No.HX200804)
关键词
迈克耳孙干涉仪
透明介质
折射率
Michelson interferometer
transparent medium
refractive index
