基于Agilent VEE的LCR自动测试系统

Auto-test system of LCR based on Agilent VEE

表贴元件,例如电容,电阻和电感,在电路设计中经常需要,测量其电性能是一项频繁而且重要的工作。但是,由于硬件上的不足,复杂的面板操作和手写记录数据使得LCR测量在大规模和高速测量上不能广泛应用。因此,通过搭建基于虚拟仪器的硬件平台,本文介绍一种LCR自动化测试系统,采用VEE编译软件编写自动化测试软件,不仅实现测试的自动化,而且实时显示结果并保存。特别的是,测试系统在连续变化条件下测量表贴元件的电性能上具有明显的优势。通过实验对比,比普通测量方法速度快10倍。

Surface mounting component,such as capacitance,resistance and inductance,is required element in circuit design,and measuring its electrical parameter is a frequent and important task.However,the restriction of hardware,such as complex panel operation and manual record result,make it difficult for large-scale and rapid test.Thus,based on virtual instrument hardware platform,the paper introduces a way of auto-test system of LCR in VEE language,not only realizing automatic testing,but also in-timely displaying the data and saving it.Especially,it has superiority on the measurement of electrical parameter under continuous variation condition.Compare with experiment,the speed of improved test means almost is 10 times faster than former.