基于泛序测试法的逻辑门故障诊断树的自动生成

Automatic Realization for Diagnosis Tree of Logic Element Fault on General Array Test

在逻辑门电路测试技术中，可以在泛序测试法基础上建立故障诊断树，用于完成单电路故障的检测与定位诊断。文章采用最小完全检测测试集和故障表Ｆ＊矩阵将故障诊断树为矩阵集合，进而利用关系数据库加以描述，并采用相应的算法自动生成。该研究旨在探索一种用数据库技术自动生成故障诊断树的方法，以达到测试参数自动获取这一目的。

In the technologys of logic circuit test,we can use diagnosis tree to finish the test of logic element fault. This paper presents the scheme for established diagnosis tree matrix on the minimal complete test set and on the logic element fault list. This study described the manager of making diagnosis tree with relational data base.It is realized the automatic establishment of the diagnosis tree with its program algorithm.