基于LabView的SiO_2抗辐射能力无损评价系统

Nondestructive Evaluation System of Anti-radiation Performance of LabView-based SiO_2

基于MOS器件中SiO2介质材料噪声灵敏表征技术,提出了SiO2介质材料抗辐射能力无损评价方法。结合噪声测试的经验及该模型为理论分析要求,使用LabView平台开发SiO2介质材料抗辐射无损评价系统。本系统由数据采集和数据分析两个部分组成,数据采集部分主要负责噪声时间序列与频谱的采集与保存,数据分析部分的主要功能为时间序和频谱的特征值分析及SiO2介质材料抗辐射能力分析与相应器件的筛选。实验结果表明,软件性能可靠,对MOSFETT抗辐射能力的评价准确。

Based on SiO2 dielectric material noise sensitive characterization techniques on MOS device,SiO2 dielectric anti-radiation methods are presented.Combined with noise measure experience and the requirements of theoretical analysis,SiO2 dielectric anti-radiation non-destructive evaluation systems are developed with LabView.This system consists of data acquisition which is responsible for noise time series and spectrum acquisition and preservation,and data analysis which is responsible for characteristic value analysis of the time sequence and the spectrum,SiO2 dielectric material anti-radiation capability analysis and screening of the corresponding devices.Results indicate that it is a reliable software which gives a more accurate evaluation of anti-radiation on the MOSFETT.