摘要
加速退化试验与加速寿命试验是解决高可靠性、长寿命产品可靠性评估等问题的两种重要加速试验技术。介绍了加速退化试验与加速寿命试验的基本概念,对两者进行了简单的比较,并进一步对加速退化试验与加速寿命试验技术的国内外相关研究现状进行了概述。最后,对该领域的研究方向进行了展望。
Accelerated degradation testing(ADT) and accelerated life testing(ALT) were two important kinds of reliability accelerated testing technology for reliability assessment of high reliability and long life products.The basic concepts of ADT and ALT were introduced,then the comparison between ADT and ALT technologies were described.The state of arts in this research concerned was then briefly reviewed.Finally,the possible directions and some suggestions were given for further research in ADT and ALT.
出处
《低压电器》
北大核心
2010年第9期1-6,共6页
Low Voltage Apparatus
关键词
加速退化试验
加速寿命试验
可靠性
accelerated degradation testing(ADT)
accelerated life testing(ALT)
reliability