利用(d,pγ)核反应p-γ符合技术进行深度分布分析初探

DEPTH PROFILING ANALYSIS BY ( d,pγ ) COINCIDENCE TECHNIQUE:A PRELIMINARY RESULT

（ｄ，ｐ）核反应广泛地应用于轻元素无损分析中，特别是深度分布分析．但当样品中存在着多种轻元素或者在厚样品的情况下，对应于各种核素甚至同一核素不同能级的带电粒子峰将会相互重叠和干扰，以至于不能进行可靠的分析．作者利用（ｄ，ｐγ）核反应ｐ－γ符合技术，通过测量与伴随γ射线相符合的带电粒子谱（质子谱），进行深度分布分析．结果表明，此符合技术能极大地降低本底，排除干扰。

d,p) nuclear reaction has been widely applied in the nondestructive analysis of light elements,especially in the analysis of depth profiling.However,when there exist many light elements in a sample or the sample is thick,a reliable analysis cannot be often obtained due to the interference of particle groups corresponding to different elements and even different energy levels of a nuclide.( d,pγ )coincidence technique is discussed.By measuring a charged particle group in coincidence with its accompanying gamma rays,the background can be greatly suppressed and the interference can be effectively eliminated.By this method,a satisfactory result has been obtained.