长基线光干涉测量与双星研究

Long Baseline Optical Interferometry and Study of Binary Stars

长基线光干涉测量将以它的高分辨率来填补双星观测的盲区,发现新的双星系统,证认被天文学家怀疑的双星系统。尤为重要的是用干涉仪可以测定密近双星的许多轨道要素,把这些结果与分光和光度观测的结果相结合,几乎可以得出这些双星所有的基本参量,其中最主要的是用于研究恒星演化的基本物理量—恒星的质量。本文介绍了光干涉测量用于双星研究的意义、原理和国际上用干涉仪进行双星研究的概况。

The study of binary stars could be a major programme for long baseline opticalinterferometry. The response of a interferometer to a binary star is related to theangular diameters of the primary and secondary, the argular seperation of thecomponents proected on the plane of the sky, et al. The observation with opticalinterferometry will determine the properties of binary system, especially, double-lined spectroscopic binaries, It will have the potential to overcome the problemsofthe non overlapping selection effects involved in visual and spectroscopic binarystudies. The study of binary stars based on interferometry and spectroscopic aswell as photometric methods will provide the important fundamental parameters,such as mass, radius, luminosity, accurate distances to binary systems beyond the reachof conventional rtigonometric parallax measurements, and will also be capable ofsurveying for new binaries. All stated above and the world progress on study ofbinary stars with optical interferometry are described in this paper.