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两腔高功率微波振荡器的频率束流负载效应研究 被引量:1

Investigation of beam-loaded frequency shifts in a two-cavity high power microwave oscillator
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摘要 在微波腔中电子束与微波场的相互作用,微波场影响电子的运动,同时电子束作为电流源也产生辐射影响微波场,是一个闭环系统.而辐射微波频率决定于两个因数:电子束的运动和微波器件的谐振频率.根据电子束同微波场之间的自洽互作用过程,给出了辐射微波频率同电子束的运动、微波器件的谐振频率之间的关系,通过2.5维PIC模拟研究了这种频率束流负载效应的特点,理论计算结果同数字模拟结果一致. When a beam passes a cavity,a rf field will be excited,which can convert the beam's electron energy into the rf field.The rf frequency is determined by two factors: electron’s movement and the cavity’s resonant frequency.A self- consistent analysis is carried out to study this relation,and a beam-loaded frequency shift is found to be present in the high power microwave oscillator bitron.Particle-incell simulation is also used to study the characteristics of the shift.The calculated beam-loaded frequency shift agrees with the simulated values.
出处 《中国科学:物理学、力学、天文学》 CSCD 北大核心 2010年第7期891-895,共5页 Scientia Sinica Physica,Mechanica & Astronomica
基金 国家自然科学基金重点项目资助(批准号:10347009) 四川省教育厅项目(编号:09ZC019) 绵阳市科技局自然科学重点项目(编号:09Y001-1)资助
关键词 高功率微波 两腔高功率微波振荡器 频率束流负载效应 high power microwaves bitron beam-loaded frequency shift
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