电感耦合等离子体原子发射光谱法(ICP-AES)测定纯铜中多种杂质元素

Determination of Admixture Elements in Pure copper by Inductively Coupled Plasma-Atomic Emission Spectrometry

本文采用电感耦合等离子体发射光谱法同时测定纯铜中的Fe、P、Cd、Co、Mn、Ni、Pb、Zn、As、Sb、Bi、Sn、S、Ag、Se、Cr、Si、Mg、Te、Al、Ti、Hg、Be、Zr、B等25种杂质元素,并以差减法计算基体铜的含量,实现了对试样基体及杂质元素含量的同时测定。以基体匹配法配制工作曲线,有效地消除基体干扰。结果表明该方法对25种杂质元素的回收率在94-103.5%,相对标准偏差低于3.0%。方法简单、快速,测定结果满意。

Admixture elements of Fe,P,Cd,Co,Mn,Ni,Pb,Zn,As,Sb,Bi,Sn,S,Ag,Se,Cr,Si,Mg,Te,Al,Ti,Hg,Be,Zr,B in pure copper are determined by inductively coupled plasma-Atomic emission spectrometry method,and the copper content are calculated by subtraction method at the same time,which make the simultaneous measurement of the contents of sample palasome and admixture elements comes true.The interference of palasome are eliminated by working curve making by palasome matching method.The results show that extraction ratio of the 25 admixture elements can reach 94 - 103.5%,while relative standard deviation lower than 3.0%.The method has got excellence of simple,convenient,and essential maturity.