一种新的舰船电子设备失效分布的探讨

New Approach to Electronic Equipment Failure Distribution of Naval Vessels

随着现代舰船电子技术的发展设备技术性能和结构要求提高,可靠性问题愈显突出。根据电子设备的现实使用情况,在其寿命方差线性变化的假设下,推导一种新的电子设备失效分布;进一步研究该分布密度函数中的参数特性,以及在完整数据情况下参数的负指数矩估计;推导新失效分布下电子设备的可靠性指标。实证分析表明选取的该电子设备失效率随时间的增长而增大,故符合推导的新分布的情况,分析结果与实际情况基本符合,说明推导的新分布及相应的密度函数性质、参数估计方法以及可靠性指数的计算等是切实可行的。

With the application of state-of-the-art electronic equipment in naval vessels, it requires more robust and reliable performance in response to increasing demand on the technical property and system structure. For this reason, a new approach to failure distribution of electronic equipment was derived given that the life-cycle variance of equipment in actual use environment varied linearly. Additionally, function＇s parameter characteristics of distribution density were examined and an estimation of parameters negative exponential moment in the case of complete data was performed. Consequently, the reliability indexes of electronic equipment for the new failure distribution were deduced. Empirical analysis was also carried out and it demonstrated that the failure probability of the equipment become greater with the increase of time. The results agree with the actual case as a whole and comply with the derivation of new failure distribution.