伪装长时记忆损害的神经回路研究

Neural Circuit of Feigning Long-term Memory Impairment

目的:探讨健康正常人伪装长时记忆损害的脑区功能激活水平和分布特点,阐明伪装长时记忆损害的脑区激活模式和中枢神经回路。方法:选择12名在读硕士生健康志愿者(男、女各半,均为右利手)为研究对象,运用大脑功能磁共振扫描技术,并结合词语两项必选模式,在扫描的同时完成诚实、伪装和随机回答。结果:与诚实回答比,伪装回答的反应时间明显延长(P<0.01);左额上、内侧回激活显著增多;与伪装回答比,诚实回答无明显激活脑区。结论:运用长时记忆材料时,与诚实反应比,伪装记忆损害具有独特的神经机制,提示长时记忆可用于检测伪装。

Objective：To explore the level of brain activity and its characteristics of distribution when health simulated feigning long-term memory impairment,and to explain the neural correlates of feigning long-term memory impairment.Methods：A total of 12 right-handed health university students（6 men,6 women）took part in this study.A functional magnitic resonance imaging test combined with a word forced-choice task were used to investigate this question.All the subjects were asked to make truth response,lie response and random response during scanning.Results：Compared with the truth response,the reaction time of lie response was significantly prolonged（P0.01）,and the significant activations were found in the left superior frontal gyrus and the left medial frontal gyrus,while no significant was found for truth response compared to the lie response.Conclusion：Compared with the truth condition,the feigning long-term memory impairment is its special neural correlates,indicating the long-term memory to use for detecting deception.