摘要
描述和分析了扫描型红外探测系统指向精度测量的必要性,并提出了一种扫描型红外探测系统指向精度的测量方法.该方法综合了内场测量和外场测量的优点,降低了系统在整个测量过程中由于检测设备的误差和检测方法不当所引起的偏差.并对误差产生的原因以及造成的结果进行了分析.有利于扫描型红外探测系统指向精度的高精度测量和校正.
The necessity of the pointing accuracy measurement of scanning type infrared detecting system was described and analyzed,and a method of pointing accuracy measurement of scanning type infrared detecting system was put forward.Colligating the advantages of infield and outfield measurement,the method reduces the error caused by the detecting equipment error and improper detecting method in the whole process of measuring.The reason and the result of the error were analyzed.The method is beneficial to high precision measurement and correction of the pointing accuracy of scanning type infrared detecting system.
出处
《光电技术应用》
2010年第3期78-80,共3页
Electro-Optic Technology Application
基金
国家部委基金项目资助
关键词
扫描
红外探测
指向精度
scanning
infrared detecting
pointing accuracy
