期刊文献+

Measuring method for micro-diameter based on structured-light vision technology 被引量:7

Measuring method for micro-diameter based on structured-light vision technology
原文传递
导出
摘要 Based on structured-light vision measurement technology, we study a measuring method for microdiameter. The measurement principle and mathematical model are described. A novel grayscale barycenter extraction algorithm along the radial direction is proposed, which can precisely gather the image coor- dinates of the ellipse-shaped light-stripe centers. The accuracy of the measurement result shows marked improvement by using the algorithm. The method executes circle fitting to the measured three-dimensional (3D) data using linear least square method, which can acquire the diameter, surface profile, and other information of the object effectively. On the scene, a line-structured light vision system using the presented method is applied to measure the curvature radius of metal blades. Experimental results show that the measurement precision of the system is higher than 2 μm. Based on structured-light vision measurement technology, we study a measuring method for microdiameter. The measurement principle and mathematical model are described. A novel grayscale barycenter extraction algorithm along the radial direction is proposed, which can precisely gather the image coor- dinates of the ellipse-shaped light-stripe centers. The accuracy of the measurement result shows marked improvement by using the algorithm. The method executes circle fitting to the measured three-dimensional (3D) data using linear least square method, which can acquire the diameter, surface profile, and other information of the object effectively. On the scene, a line-structured light vision system using the presented method is applied to measure the curvature radius of metal blades. Experimental results show that the measurement precision of the system is higher than 2 μm.
出处 《Chinese Optics Letters》 SCIE EI CAS CSCD 2010年第7期666-669,共4页 中国光学快报(英文版)
  • 相关文献

参考文献14

  • 1Z. Liu, G. Zhang, Z. Wei, and J. Jiang, Acta Opt. Sin. (in Chinese) 29, 3124 (2009).
  • 2G. Sansoni, S. Lazzari, S. Peli, and F. Docchio, in IEEE Proceedings of International Conference on Recent Advances in 3-D Digital and Modeling 19 (1997).
  • 3C. Sun, B. Liu, and P. Wang, J. Vacuum Sci. Technol. B: Microelectron. Nanometer Structures 27, 1315 (2009).
  • 4Q. Wu, J. Li, X. Su, and B. Hui, Chinese J. Lasers (in Chinese) 35, 1224 (2008).
  • 5M. Tsai and C. Hung, J. International Measurement Confederation 38, 236 (2005).
  • 6R. Y. Tsai, IEEE J. Robotics and Automation 3, 323 (1987).
  • 7K. Hu, F. Zhou, and G. Zhang, Chin. J. Scientific Instrument (in Chinese) 27, 1326 (2006).
  • 8C. Steger, IEEE Trans. Pattern Analysis and Machine Intelligence 20, 113 (1998).
  • 9P. Wang, "Study on key techniques for automatic 3D structured-light scanning system" (in Chinese) PhD. Thesis (Tianjin University, 2009).
  • 10A. W. Fitzgibbon, M. Pilu, and R. B. Fisher, IEEE Trans. Pattern Analysis and Machine Intelligence 21, 476 (1999).

同被引文献69

引证文献7

二级引证文献64

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部