摘要
提出了X射线荧光光谱法测定IC10合金的主量元素及控制限元素含量的方法。采用虚拟定值法对限量元素进行定值,用基本参数法(单点标准比较法)对主量元素进行定值。结果表明:主量元素的相对标准偏差(n=11)均小于0.35%;控制限元素的相对标准偏差均小于2.0%。
A method of XRFS for determination of major elements and elements of control contents in IC10 alloy was proposed. The elements of control contents were determined by virtual valuation method; and the major elements were determined by the basic parameter method （i. e~ the single-point comparative standard）. It was found that values of RSD＇s （n= 11） of major elements and elements of control contents were less than 0. 35 % and 2. 0%, respectively.
出处
《理化检验（化学分册）》
CAS
CSCD
北大核心
2010年第7期751-753,共3页
Physical Testing and Chemical Analysis(Part B:Chemical Analysis)
