2Siebert B R L, Sibold D, Sommer K- D. The use of Monte Carlo techniques for metrology [ A ]. NMIJ - BIPM Workshop on the Impact of Information Technology in Metrology[ C]. Tsukuba, Japan : 2005.
二级参考文献1
1Siebert B R L,Sibold D,Sommer K-D.The use of Monte Carlo techniques for metrology[A].NMIJ-BIPM Workshop on the Impact of Information Technology in Metrology[C].Tsukuba,Japan:2005.