期刊文献+

巴特沃思小波在表面形貌信号分离中的应用 被引量:7

Application of Butterworth wavelet to surface topographic signal separation
下载PDF
导出
摘要 为了快速准确地分析工程表面,提出了一种基于巴特沃思小波的滤波方法。首先,讨论了小波滤波器的低通幅度传输特性,并以此作为选择适合表面形貌分析小波滤波器的依据。然后,介绍了巴特沃思小波滤波器的构造原理,并给出了它的快速实现算法;综合其优良的传输特性和高效的实现算法,以巴特沃思小波作为表面分析的滤波器,对实际表面轮廓进行了多层分解。最后,利用巴特沃思小波建立了表面轮廓评定的基准线,并给出了确定小波分解层数的方法。实验结果表明,巴特沃思小波能够快速准确地实现表面轮廓的多尺度分析,稳定可靠地提取表面中线;在普通计算机上提取11200点数据表面中线仅耗时60ms,利用该中线计算所得R值相对误差仅比利用高斯中线所得R值相对误差大0.12%。 In order to analyze engineering surfaces fast and accurately,a new filtering approach based on Butterworth wavelet is proposed.Firstly,the transmission characteristic of a low-pass filter based on a wavelet is discussed,then it is taken as a primary reference to choose an appropriate wavelet base for surface analysis.The construction principle of the Butterworth wavelet filter is briefly introduced,and a fast algorithm for implementing this filter is illuminated.By combining the eminent transmission characteristic and efficient algorithm,the Butterworth wavelet is selected as the analyzing filter to decompose the surface profile with arbitrary orders.Finally,the Butterworth wavelet is also applied to calculating the reference line for profile evaluation and to offering a method to determine decomposed orders.The experimental results indicate that the Butterworth wavelet can achieve the multi-scale analysis of surface profile quickly and accurately and can extract its mean line reliably.The total calculation of this extraction for 11 200 data points only costs 60 ms by general PC and the relative error of Ra obtained by this extracted mean line is only 0.12% larger than the result by Gaussian filter.
出处 《光学精密工程》 EI CAS CSCD 北大核心 2010年第7期1661-1667,共7页 Optics and Precision Engineering
基金 教育部留学回国人员科研基金资助项目(No.AEBQ24403704)
关键词 表面计量学 小波分析 巴特沃思小波 幅度传输特性 surface metrology wavelet analysis Butterworth wavelet amplitude transmission characteristic
  • 相关文献

参考文献14

  • 1BRUZZONE A A G,MONTANARO J S,FERRANDO A,et al..Wavelet analysis for surface characterisation:an experimental assessment[J].CIRP Annals -Manufacturing Technology,2004,53(1):479-482.
  • 2International Organization for Standardization.ISO4287:1997.Geometrial product specificatin(GPS)-surface texture:profile method-terms,definitions and surface texture parameters[S].Switzerland:International Organization for Standardization.
  • 3张浩,袁怡宝,张峰,许景波.广义B样条滤波器在表面形貌测量中的应用[J].光学精密工程,2008,16(9):1722-1726. 被引量:5
  • 4许景波,袁怡宝,刘泊.B样条滤波器建立表面轮廓中线的方法[J].光学精密工程,2008,16(8):1411-1415. 被引量:4
  • 5李海燕,刘国栋,刘炳国,浦昭邦.双密度小波在表面形貌信号分离中的应用[J].光学精密工程,2008,16(6):1093-1097. 被引量:5
  • 6RAJA J,MURALIKRISHNAN B,SHENGYU F.Recent advances in separation of roughness,waviness and form[J].Precision Engineering,2002,26(2):222-235.
  • 7XIAO S J,JIANG X Q,BlUNT L,et al..Comparison study of the biorthogonal spline wavelet filtering for areal rough surfaces[J].International Journal of Machine Tools & Manufacture,2001,41(13-14):2103-2111.
  • 8SHENGYU F,MURALIKRISHNAN B,RAJA J.Engineering surface analysis with different wavelet bases[J].Journal of Manufacturing Science and Engineering,2003,125:844-852.
  • 9AMIR Z A,VALERY A Z.Construction of bior-thogonal discrete wavelet transforms using interpolatory splines[J].Applied and Computational Harmonic Analysis,2002,12(1):25-56.
  • 10AMIR Z A,ALEXANDERl B P,VALERY A Z.Butterworth wavelet transforms derived form discrete interpolatory splines; recursive implementation[J].Signal Processing,2001,81(11):2363-2382.

二级参考文献33

共引文献10

同被引文献53

引证文献7

二级引证文献48

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部