ADC测试中INL与THD之间的关系

The Relationship between INL and THD in ADC Testing

随着ADC测试技术的不断发展,码密度直方图技术以及采用正弦波输入的离散傅里叶变换(DFT)频域分析技术已经被广泛应用到ADC的仿真和测试分析中。相对于采用DFT进行频域分析获取ADC的动态性能的复杂性来说,采用码密度直方图的方法能简单地得到微分非线性(DNL)和积分非线性(INL)这两个静态性能指标。文章通过对一个10位ADC的行为级模型的仿真分析,阐述了总谐波失真(THD)与INL之间的内在联系,从而提出了通过对INL的测试来评估ADC的THD性能的方法,对今后ADC电路的测试和评估具有指导意义。

With the development of the ADC test technology,code density histogram testing and DFT spectral analysis are widely used in ADC simulation and test analysis.Compare to the complexity of DFT spectral analysis which obtains the dynamic performance of ADC,The code density histogram testing can easily acquire the DNL and INL.This paper illuminates the potential relationship between THD and INL by using a 10-bit ADC behavior model.Thereby provide a method to evaluate the THD performance by testing the INL parameter,which can guide the test and evaluation for ADC circuits in future.