闪烁晶体光谱特性多参数综合测试技术研究

Measurement Technology for Multi-Parameter Spectral Responsivity of X-Ray Scintillation Crystals

针对山西长城微光器材股份有限公司新型闪烁晶体材料的研制需求,研究了一种针对某闪烁晶体受X射线激发后光谱响应的多参数综合光电检测系统。通过系统的光谱输出接口直接测试闪烁晶体的射线转换光谱,通过电压输出接口测试PIN光敏二极管输出的光伏电压,进而采用等效电路法计算闪烁晶体的荧光逸出功率。测试结果表明,荧光逸出效率随X射线管电流的增大而减小。本研究对其他闪烁晶体光谱特性的测试具有借鉴价值。

Aimed at the measurement demand for development of better X-ray scintillation crystals,a photoelectrical detector for integrally test the multi-parameter spectral responsivity of scintillation crystals was developed.The conversion spectrum of the scintillation crystal excited by various X-ray energies under the critical focal length could be measured directly through the spectral output interface by one spectrometer,and the photovoltaic effect voltage of the PIN photodiode could be tested through the voltage output interface by one oscilloscope.Furthermore,the output power of fluorescence was calculated using an equivalent circuit.The measurement results show that the conversion efficiency of the scintillator declined along with the current increase of the X-ray tube while it has weak relation with the change in tube voltage.The experimental results show that the method presented in this paper is helpful for testing the scintillator properties.