摘要
本文综述了国内、外立体视觉检测技术和IC芯片视觉检测设备的发展现状，提出了基于条纹结构光的立体视觉检测方法，并将其应用于IC芯片的测量，结合2D视觉，实现了IC芯片的精密检测平台。
This paper reviews the domestic and foreign stereoscopic vision detection technology and the IC chip,the development of visual inspection equipment status stripe structured light is proposed based on three-dimensional visual inspection methods,and applied to the measurement of IC chips,combined with 2D vision to achieve the IC chip precision measurement system.
出处
《计算机光盘软件与应用》
2010年第8期41-41,共1页
Computer CD Software and Application
关键词
立体视觉
机器视觉
自动光学检测
IC芯片检测
Stereo vision
Machine vision
Automatic optical inspection
IC chip testing.
