摘要
本文利用X射线衍射仪对高频硫氮共渗层的相结构进行了分析,发现渗层表层部位主要由FeS、Fe_3O_4及ζ-Fe_2N等相组成,中间白亮层为ζFe_2N+ε-Fe_3N,扩散层由α-Fe+ε-Fe_(2-3)N等组成。
The high freguency sulfonitriding layers has been characterized by using X-ray diffraction method in this paper. The result showed that the surface layer included FeS、 Fe3O4 and ξ-Fe2N phases, the middle nitrided region were ξ-Fe2N 、and ε-Fe3N, the inner diffusion rgion were α-Fe and ε-Fe2-3N.
出处
《物理测试》
CAS
1999年第2期24-25,共2页
Physics Examination and Testing
关键词
硫氮共渗
相结构
X射线衍射分析
渗层
induction heating
sulfonitriding
phase structrue
X-ray diffraction
