摘要
介绍了一种用于微波电路的中功率薄膜衰减器的设计与制作。该衰减器是由铝原子含量为50%的Ta/Al合金薄膜制成。测试结果表明其性能优良。
In this paper,design and fabracation of a middling-power thin film attenuator for microwave circuits are described. The attenuator is made from a Ta/Al thin film which contains aluminium of 50%. Finally, the rneasured data of experiment indicates that the attenuator has high performance.
出处
《仪器仪表学报》
EI
CAS
CSCD
北大核心
1999年第2期210-212,共3页
Chinese Journal of Scientific Instrument