图形测试:多工位模拟和混合信号器件并行测试效率的关键(第二部件)

Pattern-Based Testing:The Key to Parallel Test Efficiency in Multisite Analog and Mixed-Signal Device Testing

多工位测试是许多模拟和混合信号器件生产厂家大批量生产测试的基石.随着测试工位数的增加,模拟和混合信号测试系统设计者需要努力克服历来限制并行测试效率(PTE:Parallel Test Efficiency)的架构上的不足。在第一部分中,我们介绍了并行测试效率PTE及其随工位数增加对测试成本的影响,突出了一些效率高的多工位测试系统的重要特性。第二部分我们将介绍pattern-based测试和有关的SmartPin硬件和软件。

Multisite testing is the cornerstone of high volume production testing for most analog and mixed-signal device manufacturers.As site counts grow,analog and mixed-signal test system designers strive to overcome the historical architectural deficiencies that have limited Parallel Test Efficiency（PTE）.In Part 1 of this series,we introduced PTE and its impact on cost-of-test as site count rises,and highlighted some of the important characteristics of efficient multisite test systems.In Part 2 of the series,we will introduce pattern-based testing,and the SmartPin？ hardware and software associated with it.