Z箍缩诊断中椭圆晶体谱仪测量数据的处理

Data processing for elliptical crystal spectrometer used in Z-pinch diagnostic

以氖气喷气Z箍缩的实验结果为例,详细讨论了椭圆晶体谱仪测量数据的处理方法,包括使用标定结果将胶片黑密度转换为X光强度,根据已知谱线的能量和扫描点序号对测量能谱的能点进行定标,以及使用Henke给出的考虑谱仪非均匀色散效应、晶体积分反射率和X光滤片透过率后的公式对测量能谱的强度进行修正,给出了最终的解谱结果。并使用Lorentz线型函数拟合谱线轮廓,求出了Hα,Heα和Heβ等K壳层谱线的相对强度,对处理后能谱强度的误差进行了简单分析。

Elliptical crystal spectrometers are key instruments to detect the line spectra of soft X-rays in Z-pinch diagnostics. This paper deals with the data processing for an elliptical crystal spectrometer. Taking the diagnostic results obtained in a neon gas-puff Z-pinch experiment as an example,the detailed processes,such as changing the optical density to X-ray intensity according a calibrated film response curve,determining the X-ray energy of the measured spectrum using the energy and the order number of scanned point of identified spectral lines,and correcting the intensity of spectrum using the formula given by Henke are discussed. In the Henke＇s formula,the effect of nonuniform dispersion,integrated reflectivity of crystals and transmission of X-ray filters are considered. The final unfolding results are presented,including the relative intensities of several neon K-shell lines （Hα,Heα and Heβ,etc.） given by Lorentz fitting. The relative errors of the spectral intensities are also briefly discussed.