摘要
以普通玻璃为衬底,采用溶胶-凝胶旋涂法制备出c轴择优取向性、高可见光透过率以及低电阻率的ZnO:Sn(TZO)薄膜。利用X射线衍射仪(XRD)、扫描电子显微镜(SEM)、四探针及紫外-可见分光光度计(UV-VIS)等手段,研究了不同Sn掺杂浓度对薄膜的晶体结构、表面形貌、电学和光学特性的影响。实验结果表明,在500℃的空气中热处理,然后在低温环境快速冷却,得到的TZO薄膜均具有六角纤锌矿结构,且呈c轴择优取向,薄膜在可见光范围内平均透光率超过90%,同时当Sn掺杂浓度为3 at.%时,薄膜的电阻率达到最小值8.2×10-1Ω.cm。
Transparent and conductive high-preferential c-axis-oriented Sn-doped ZnO(TZO) thin films have been prepared on common glass substrates by sol-gel spin coating method.The influence of the structure on electrical and optical properties of TZO films are investigated by X-ray diffraction(XRD),scanning electron microscopy(SEM),four-point probe method and UV-VIS spectrophotometer,respectively.The result proved that the films are all polycrystalline with a structure of preferred orientation of c-axis ZnO hexagonal wurtzite type.All films show high transmittance of 90 % in the visible light range.The films doped with 3 at.% Sn concentration hold a highly preferred c-axis-oriented column shaped crystalline structure and exhibit the lowest resistivity of 8.2×10-1 Ω·cm.
出处
《功能材料与器件学报》
CAS
CSCD
北大核心
2010年第4期394-398,共5页
Journal of Functional Materials and Devices
基金
教育部科技重大项目(309027)
甘肃省科技攻关基金项目(2GS057-A52-004)
关键词
TZO薄膜
Sn掺杂浓度
溶胶-凝胶法
结构与形貌
光电特性
TZO thin films
doped concentration
sol-gel method
structure and morphology
electrical and optical properties