摘要
针对测试硬件种类增多导致的测试路径连接复杂、人工配置困难的问题,提出了一种在建立测试系统数据模型的基础上实现的测试路径自动选择算法;该算法将测试设备及被测元件的通道信息纳入到测试系统数据模型中,根据硬件设备信号通道的具体条件为依据,以通过测试路径后测试信号的衰减值最小为最优路径的判别条件,通过测试系统软硬件的交互,实现了测试路径的最优配置;该算法提高了测试路径配置的效率,同时提高了测试程序集的可移植性。
Test path configuration is becoming a more and more complicated question with the development of automatic test equipment. For reducing difficulties of test path configuration, a searching algorithm of Artificial Intelligence based on ATS model is presented in this paper, which is, applied to select the best test path between ATE signal ports and UUT test ports according to sign attenuation. And it realizes the connections between TPS and test hardware resource and improves the interehangeabilities of TPS.
出处
《计算机测量与控制》
CSCD
北大核心
2010年第8期1733-1735,共3页
Computer Measurement &Control