红外发光二极管辐射波长和强度积分式瞬时测试技术

The Snap Integrating Measuring Technology for Wavelength and Intensity Radiated by Intrared Emission Device

发展了一种红外发光二极管（ＩＲＥＤ）辐射波长和强度的积分式（非分光）测试技术。它采用两只不同光谱响应的光电探测器，一只探测器的相对光谱响应在足够宽光谱范围内修正成常数，另一只探测器也按要求用滤光器修正。辐射强度可由相对光谱响应为常数的探测器测量；通过对测得的两个光探测器光电流之比与波长关系的数据进行处理，可以快速获得ＩＲＥＤ的辐射波长。以ＭＣＳ—５１单片机和上述两个光电探测器及它们的有关电路组成了一台样机实现这个原理。仪器具有高速实时，稳定性好及智能化的优点。

A kind of snap integrating (non spectral) measuring technology for wavelength and intensity of IRED was developed. Two detectors which are different in spectral response were adopted. The curve of the relative spectral response of one detector was changed into constant in a limited spectral region,and the another one was also changed as demand by filters. The radiated intensity could be measured by the detector having constant spec- tral response and the wavelength could be obtained by processing the data of relations between the ratio of two photoelectric currents and the wavelength of incoming light. An instrument made up by single chip computer MCS-- 51,the two above detectors and its relative electric circuits was fulfilled to realize this new measuring technology. It has the benefit of high speed, good repetitiveness,and intellectualization.