期刊文献+

A 1.2-V 19.2-mW 10-bit 30-MS/s pipelined ADC in 0.13-μm CMOS

A 1.2-V 19.2-mW 10-bit 30-MS/s pipelined ADC in 0.13-μm CMOS
原文传递
导出
摘要 A 10-bit 30-MS/s pipelined analog-to-digital converter(ADC) is presented.For the sake of lower power and area,the pipelined stages are scaled in current and area,and op amps are shared between the successive stages. The ADC is realized in the 0.13-μm 1-poly 8-copper mixed signal CMOS process operating at 1.2-V supply voltage. Design approaches are discussed to overcome the challenges associated with this choice of process and supply voltage, such as limited dynamic range,poor analog characteristic devices,the limited linearity of analog switches and the embedded sub-1-V bandgap voltage reference.Measured results show that the ADC achieves 55.1-dB signal-to-noise and distortion ratio,67.5-dB spurious free dynamic range and 19.2-mW power under conditions of 30 MSPS and 10.7- MHz input signal.The FoM is 0.33 pJ/step.The peak integral and differential nonlinearities are 1.13 LSB and 0.77 LSB,respectively.The ADC core area is 0.94 mm^2. A 10-bit 30-MS/s pipelined analog-to-digital converter(ADC) is presented.For the sake of lower power and area,the pipelined stages are scaled in current and area,and op amps are shared between the successive stages. The ADC is realized in the 0.13-μm 1-poly 8-copper mixed signal CMOS process operating at 1.2-V supply voltage. Design approaches are discussed to overcome the challenges associated with this choice of process and supply voltage, such as limited dynamic range,poor analog characteristic devices,the limited linearity of analog switches and the embedded sub-1-V bandgap voltage reference.Measured results show that the ADC achieves 55.1-dB signal-to-noise and distortion ratio,67.5-dB spurious free dynamic range and 19.2-mW power under conditions of 30 MSPS and 10.7- MHz input signal.The FoM is 0.33 pJ/step.The peak integral and differential nonlinearities are 1.13 LSB and 0.77 LSB,respectively.The ADC core area is 0.94 mm^2.
出处 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2010年第9期134-140,共7页 半导体学报(英文版)
基金 supported by the National High Technology Research and Development Program of China(No.2009AA011600) the Project for Young Scientists Fund of Fudan University,China(No.09FQ33) the State Key Laboratory ASIC & System(Fudan University), China(No.09MS008)
关键词 analog-to-digital converter PIPELINED sampling capacitor two-stage op amp compensation linearity of analog switch sub-1-V bandgap voltage reference analog-to-digital converter pipelined sampling capacitor two-stage op amp compensation linearity of analog switch sub-1-V bandgap voltage reference
  • 相关文献

参考文献15

  • 1Huang T. Low voltage and low power aspect of data converter design. IEEE Euro Solid-State Circuits Conf, 2004:29.
  • 2Cho T. Low-power low-voltage analog-to-digital conversion techniques using pipelined architectures. PhD Thesis, UC Berkeley, 1995:136.
  • 3Min M, Kim P, Bowman F, et al. A 69-mW 10-bit 80-MSample/s pipelined CMOS ADC. IEEE J Solid-State Circuits, 2003, 38(12): 2031.
  • 4Hurst J, Lewis S, Keane J, et al. Miller compensation using current buffers in fully differential CMOS two-stage operational amplitiers. IEEE Trans Circuits Syst I, 2004, 51(2): 275.
  • 5Dessouky M, Kaiser A. Input switch configuration for rail-to-rail operation of switched opamp circuits. Electron Lett, 1999, 358(1): 8.
  • 6Singler L, Ho S, Timko M, et al. A 12b 65Msample/s CMOS ADC with 82 dB SFDR at 120 MHz. Proc IEEE Int Solid-State Circuits Conf, 2000:38.
  • 7Dessouky M, Kaiser A. Very low-voltage digital-audio-modulator with 88-dB dynamic range using local switch bootstrapping. IEEE J Solid State-Circuits, 2001, 36(3): 349.
  • 8Li J, Zeng X, Zhang J, et al. Design of an ADC for subsampling video applications. Analog Integr Circ Sig Process, 2006, 49(3): 303.
  • 9Leung N, Mok P. A sub-l-V 15-pprn/C CMOS bandgap voltage reference without requiring low threshold voltage device. IEEE J Solid-State Circuits, 2002, 37(4): 526.
  • 10Varzaghani A, Yang C K K. A 600-MS/s 5-bit pipeline A/D converter using digital reference calibration. IEEE J Solid-State Circuits, 2006, 41:310.

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部