ICP-AES测定高纯钨中杂质元素

DETERMINATION OF TRACE ELEMENTS IN HIGHER PURE TUNGSTEN BY ICP AES

采用电感耦合等离子体原子发射光谱法（即ＩＣＰＡＥＳ法）测定钨中的１４种杂质元素，并对１９种微量元素的基体效应和光谱干扰进行了研究，建立了ＩＣＰＡＥＳ与基体分离及干扰系数校正相结合的方法．此法解决了钨在分析测定时的基体干扰问题，能快速、准确、同时测定高纯钨中１４种微量元素，回收率高于９０％，相对标准偏差为１％～６％．它为钨产品的检测提供了新的切实可行的分析手段．

The matrix eftect and spectral interference of tungsten on the determination of 19 trace elements were studied, and a method, ICP AES combined with the matrix seperation and factor correction, was established. This method solved the problem of the matrix interference in the analysis of tungsten, and the accurate determination of 14 trace elements in higher pure tungsten rapidly at the same time came true. The recoveries were above 90%. The relative standard deviations were 1%～6%. This method provides a new and feasible way for the analysis of the production of tungsten.