密封电子元器件微粒碰撞噪声自动检测系统的研究

Research on Particle Impact Noise Auto Detecting System for Sealed Electronic Components

密封电子元器件内部存在多余物,多年来一直是困扰其应用与发展的关键因素。针对以往多余物微粒碰撞噪声检测(PIND)系统中存在检测精度低、误判和漏判率高等问题,文章提出一种基于小波分析的多余物自动检测方法,研制了具有自主知识产权的密封电子元器件微粒碰撞噪声检测系统。实验结果表明,检测系统运行稳定,性能优异,用户界面友好,各项技术指标均优于国际同类产品。文章提出的检测方法亦适用于其他航天产品的多余物检测。

The existence of remainder particles in sealed electronic components become a large problem from ist applica- tion and development. Due to traditional Particle Impact Noise Detection （PIND） system for remainder detection with low precision, high leave out rate and wrong judgment rate, this paper presents a remainder auto detecting method based on wavelet analysis, designs a particle impact noise auto detecting system for sealed electronic components with self-owned intel- lectual property rights. The experiment result indicates that the detecting system runs stably with friendly human inerface, the performance is excellent, the mainly indexes excelled the same type product in world. The system is also suitable for remainder detecting for other aerospace products.