DSP功能测试方法研究

Research on Functional Test Method of DSP

随着数字信号处理器(DSP)性能和集成度迅速地提高,DSP产品得到了日趋广泛的应用。文章首先介绍了DSP的基本结构,其次详细分析了DSP功能测试的方法,特别是研究了由测试系统模拟外部程序存储器加载程序的并行测试算法,最后讨论了为使用相同指令集的DSP自动生成测试图形的算法。上述算法具有直观、编程灵活、开发周期短的特点。

With the rapid development of performance and integration of the digital signal processor, the production based on DSP is applied abroad. In this paper, we introduce the common structure of the DSP first, and then discuss the functional test method, especially DSP parallel test algorithm for simulating external program memory loading programs by ATE, finally we discuss the automatic test pattern generation algorithm for DSPs which use the same instruction set. Our method is intuitive,programming flexiblility, and has short development cycles.