构建数量性状基因图的双侧标记基因型均值回归法

REGRESSION METHOD FOR MAPPING QUANTITATIVE TRAIT LOCI WITH MEANS OF FLANKING MARKER GENOTYPES

提出一种构建数量性状基因（ＱＴＬ）图的双侧标记基因型均值回归法．该方法利用染色体上某一区间的双侧标记基因型的数量性状均值为依变数，以该区间内任一点假定存在ＱＴＬ的加性效应和显性效应的系数为自变数进行二元线性回归分析，估计出ＱＴＬ的加性和显性效应，并测验该点是否存在ＱＴＬ，ＱＴＬ的最可能位置则根据测验统计数取最大值的点而确定；同时，在某一标记区间测验时，利用多元线性回归方法将该区间外可能存在的ＱＴＬ进行统计控制．该方法简便易行。

A simple statistical method for mapping quantitative trait loci regression with means of flanking marker genotypes was proposed in this paper. Which used the quantitative trait means of flanking marker genotypes as dependent variable Y, the coefficient of additive and dominance effect of putative QTL in a interval as independent variable X 1 and X 2 . Like Lander and Botstein′s interval mapping, this method can be performed at any position in a genome covered by markers. The effect and location of QTL can be estimated simutaneusly. For increasing the estimation precision of QTL location, the interference of other relative QTL was controlled statistically as Zeng′s composite interval mapping when scanning QTL in a interval. The analyzing procedure was demonstrated with Zheng′s data of rice fertile rate and the difference between this method and interval mapping was compared directly. The result showed the feasibility of this method for mapping QTL.