均匀圆阵阵元缺损对阵列方向图影响的分析

Analysis of the Array Pattern with Defect Array Element in the Uniform Circle Array

阵列中阵元接收信号按照一定加权方式合成,使波束方向图指向期望信号同时抑制其他方向的干扰信号。但是当阵列中有阵元缺损时,会对阵列方向图产生一定影响。本文分析并仿真了均匀加权情况下,均匀圆阵无缺损的波束方向图,同时对比了具有相同波束指向的均匀圆阵和均匀线阵在缺损阵元位于不同位置的波束方向图。仿真表明缺损一个阵元后,均匀加权的均匀圆阵性能下降较多。而当缺损阵元位于不同阵列不同位置时,对均匀线阵影响有较大不同,但是对均匀圆阵的影响则相差不多。

Received signals of array element can be synthesized according to some weighting forms, to make the array pattern point to desired signal and suppress interference signal in other directions. When one array element in the array is broken, the array pattern will be changed. This paper analyzes and simulates the uniform circle array pattern without defect array element, and compares with the array pattern of uniform circle array and uniform line array with one defect array element in different location. The simulation results show that the performance degradation of uniform circle array when the array have one defect array element. With different defect array element location, uniform line array have quite difference but uniform circle array have similar difference.