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条纹图像相位提取方法研究 被引量:1

Research on Phase Extracting from Fringe Patterns
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摘要 条纹图像的相位提取在现代干涉测量中起着十分重要的作用。从算法原理、研究现状和适用范围等几个方面对比分析了现有的几种条纹图像的相位提取方法,包括相移法、载波法和基于经典算法的相位提取方法。经分析发现,相移法理论上具有较高的解调相位精度,但需获得多幅不同相位的条纹图和保持机械稳定性,这使得其只适用于静态或准静态干涉测量;而在瞬态或动态干涉测量中,载波法能从单幅图像中获得相位,自动化程度高,且对外界环境要求低,适用于开放条纹;基于经典算法的相位提取方法通过评价函数的设计及参数优化来获得相位,但处理时间相对过长,适用于封闭条纹。综合分析,载波法具有更广泛的应用前景。 The phase extracting from fringe patterns plays a very important role in the modern interferometry. Several methods of the phase extracting from fringe patterns are compared and analyzed from the algorithm principle, development status and application scope respectively, including the phase shifting method, the method based on carrier and the phase-extracting method based on classical algorithm. The phase shifting method has a high demodulate precision of the phase in theory, but requires several fringe patterns with different phases and maintaining stable mechanical stability, so it is only suitable for the static or quasi-static measurement. In the tran- sient or dynamic measurement, the method based on carrier can obtain the phase from the single fringe pattern, and has high automatism and low environment requirement. It is suitable for the opening fringe. The phase extracting method from fringe patterns based on the classical algorithm can obtain the phase through the design of the cost function and the optimization of the parameters, but the computation time is longer relatively. It is suitable for the closed fringe. Based on the comprehensive analysis, the method based on carrier has a wide application prospect.
出处 《微纳电子技术》 CAS 北大核心 2010年第9期573-579,共7页 Micronanoelectronic Technology
基金 国家自然科学基金资助项目(60976077)
关键词 干涉测量 条纹图像 相位提取 开放条纹 封闭条纹 interferometry fringe patterns phase-extracting opening fringe closed fringe
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参考文献20

  • 1SERVIN M,MARROQUIN J L,CUEVAS F J.Demodulation of a single interferogram by use of a two-dimensional regularized phase-tracking technique[J].Applied Optics,1997,36(19):4540-4548.
  • 2NICOLAUS R A.Precise method to determine systematic errors in phase-shifting interferometry on Fizeau interferences[J].Applied Optics,1993,32(31):6380-6386.
  • 3GROOT P D.Phase-shift calibration errors in interferometers with spherical Fizeau cavities[J].Applied Optics,1995,34(16):2856-2863.
  • 4SCHWIDER J,FALLKENSTIRFER O,SCHREIBER H,et al.New compensating four-phase algorithm for phase-shift interometry[J].Optics Engineering,1993,32(8):1883-1885.
  • 5钱克矛,缪泓,伍小平.一种用于动态过程测量的实时偏振相移方法[J].光学学报,2001,21(1):64-67. 被引量:29
  • 6TAKETA M,INA H,KOBAYASHI S.Fourier-transform method of fringe-pattern analysis for compater-hased topography and interferometry[J].J Opt Soc Am,1982,72(1):156-160.
  • 7ICHIOKA Y,INUIA M.Direct phase detecting system[J].Applied Optics,1971,11(7):1507-1514.
  • 8SERVIN M,MALACARA D,CUEVAS F J.Direct-phase detection of modulated Ronchi rulings using a phase-locked loop[J].Optial Engineering,1994,33(4):1193-1199.
  • 9KEMAO Q Windowed fourier transform for fringe pattern analysis[J].Applied Optics,2004,43(18):2695-2702.
  • 10KEMAO Q,SOON S H.Two-dimensional windowed Fourier transform for noise reduction in fringe pattern analysis.[J].Optical Engineering,2005,44(7):0705601-1-0705601-9.

二级参考文献23

  • 1翁嘉文,钟金钢.伸缩窗口傅里叶变换在三维形貌测量中的应用[J].光学学报,2004,24(6):725-729. 被引量:28
  • 2傅绍军,洪义麟,陶晓明,齐开国.离子束刻蚀位相型Ronchi光栅研究[J].量子电子学,1995,12(2):146-149. 被引量:2
  • 3郑素珍,陈文静,苏显渝.自适应窗口傅里叶变换三维面形检测技术[J].光电工程,2005,32(9):51-54. 被引量:11
  • 4Zhong Jingang, Weng Jiawen. Dilating Gabor transform for the fringe analysis of 3-D shape measurement[J]. Opt. Engng.,2004, 43(4):895-899.
  • 5David P. Casasent, John Scott Smokelin, Anqi Ye. Wavelet and Gabor transforms for detection[J]. Opt. Engng. , 1992, 31(9) :1893-1898.
  • 6Rong-Seng Chang, Jin-Yi Sheu, Ching-Huang Lin et al..Analysis of CCD Moire pattern for micro-range measurements using the wavelet transform[J]. Opt. and Laser Technol. , 2002,35(1): 43-47.
  • 7H. Jeong. Analysis of plate wave propagation in anisotropic laminates using a wavelet transform[J]. NDT&E International,2001, 34(1) :185-190.
  • 8Brian Telfer, Harold H. Szu. New wavelet transform normalization to remove frequency bias[J]. Opt. Engng. , 1992,31(9): 1830-1834.
  • 9Rene A. Carmona, Wen L. Hwang, Brun Torr6sanl.Characterization of signals by the ridges of their wavelet transforms[J]. IEEE Transactions on Signal Processing, 1997,45(10): 2586-2590.
  • 10Cesar A. Sciammarella, Taeeeui Kim. Determination of strains from fringe patterns using space-frequency representations[J]. Opt. Engng., 2003, 42(11):3182-3193.

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