摘要
以便精确为获得卷未加工的丝绸的上好测量直径，未加工的丝绸的物理特征被分析。借助于夫累Ｘ尔原则，不同透明未加工的丝绸细丝引起的衍射被分析并且模仿。数字互补金属氧化物半导体照相机测量的未加工的丝绸细丝的图象数据为与不到 1% 的相对错误获得细丝的精确直径被分析并且处理。在细丝的适当椭圆形的剖面图的假设上，剖面图区域作为细丝的上好被计算。测量实验被执行。最后，一些建议为光电的测量被建议未加工的丝绸的上好。
In order to precisely measure the diameters for obtaining the fineness of rolling raw silk, the physical features of raw silk are analyzed. By means of Fresnel principle, diffractions caused by different transparent raw silk filaments are analyzed and simulated. Image data of raw silk filament measured by digital CMOS camera are analyzed and processed for obtaining the precise diameters of the filamerit with the relative error of less than 1%. On the assumption of appropriate elliptic cross-section of the filament, the cross-section area is calculated as the fineness of the filament. Measurement experiments are carded out. Finally, some suggestions are proposed for photoelectric measuring the fineness of raw silk.
