摘要
测量了不同离子掺杂Bi2Sr2CaCu2Oy多晶样品的射频介电常数,发现样品的介电常数存在明显差别,分析认为这是由于离子掺杂改变了材料中的载流子浓度,导致材料的空间电荷极化差异所引起的。基于这种机制,成功解释了不掺杂样品在1700MHz附近的弛豫现象和不同样品损耗性质的差异。
The radio frequency dielectric constant of polycrystalline Bi-based cuprates with different dopant ions is measured. It is found that the dielectric constant shows large difference among samples, which can be attributed to the difference of the interracial polarization in samples due to the changes of carrier density with doping. Based on this mechanism, the relaxation phenomena that found in BizSr2CaCu2Oy sample around 1700MHz and the loss tangent difference of samples can be successfully explained.
出处
《材料导报》
EI
CAS
CSCD
北大核心
2010年第18期15-16,27,共3页
Materials Reports
基金
国家自然科学基金(50672001)
安徽大学人才队伍建设经费项目资助
关键词
电工材料
介电性质
Bi系铜氧化物
空间电荷极化
损耗角正切
electric materials, dielectric properties, Bi based cuprates, interracial polarization, loss tangent
