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双极型集成电路可靠性技术 被引量：8

Reliability Technology for Bipolar Integrated Circuits
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摘要 介绍了影响双极型集成电路可靠性的主要因素,重点分析了当前国内外双极型集成电路可靠性的研究方法。通过在设计、工艺、原材料和元器件等方面采取对策和措施,可达到提高双极型集成电路可靠性的目的。 Major problems associated with reliability of bipolar ICs were discussed.Techniques to investigate reliability of bipolar IC＇s were described in particular.It is concluded that the reliability of bipolar IC＇s could be improved by using proper design techniques or processing technologies,and choosing right materials or components.
作者 罗俊 秦国林 邢宗锋 李志强
机构地区 中国电子科技集团公司第二十四研究所 中国科学院微电子研究所
出处 《微电子学》 CAS CSCD 北大核心 2010年第5期747-753,共7页 Microelectronics
关键词 双极型集成电路 可靠性 失效模式 辐射加固 Bipolar IC Reliability Failure mode Radiation hardening
分类号 TN431 [电子电信—微电子学与固体电子学] TN406 [电子电信—微电子学与固体电子学]
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参考文献16

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共引文献36

同被引文献28

  • 1张春华,温熙森,陈循.加速寿命试验技术综述[J].兵工学报,2004,25(4):485-490. 被引量：101
  • 2刘婧,吕长志,李志国,郭春生,冯士维.电子元器件加速寿命试验方法的比较[J].半导体技术,2006,31(9):680-683. 被引量：22
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引证文献8

二级引证文献10

微电子学
2010年 第5期

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