摘要
文章针对LCD内部线路电阻偏大引起的显示不良,研究了一种新的探测手段,即采用高频测试以有效检出不良。
This paperintroduces a brand-new detection means forabnormal resistance in the internal circuit of LCD.Developed on high frequency driving,it could replace the traditional functional test,which only apply low voltage and low frequency driving.
出处
《现代显示》
2010年第10期14-16,共3页
Advanced Display
关键词
高频
LCD
电阻偏大
显示不良
high frequency
LCD
larger resistance
abnormal display.
