摘要
近十几年来Wilkens利用位错分布理论对于WarenAverbach(WA)付氏分析法中弯勾现象、嵌块尺寸及微观应变等问题提出了自己的见解认为这些方面出现的误差是由于WA理论本身必然造成的本文没有从理论的根源去解释这些矛盾的出现,而是从WA付氏分析中数学归一出现的错误,提出了自己的修正简单地用一个参数m来说明Wilkens用几个参数说明的问题,从而定性地说明两种理论模型表面上有所不同。
In recent years Wilkens has elucidated the hook effect, the microcrystal size and the microstrain concerning the Fourier analysis in the light of the theory of dislocation distribution. According to him, the Warren Averbach theory would mevltably lead to the errors in these aspects. This thesis,based upon Wilkens' X ray Diffraction Line Broacing of Crystals Containing Small Angle Bound aries (1977, J.Appl. Cryst, 12,119-125), attempts to correct these errors by explaining the mistakcs accompanying the mathematical norminalization of the Fourier analysis insteas of elucidating them in terms of the founation of the Warren Averbach theory. In so doing, it simply uses one parsmeter to explain the a same problems that Wilkens uses several parameters to explain, and qualitatively explain that these two theorical frameworks are, in essence, the same although they look some different.
出处
《天津理工学院学报》
1999年第1期35-40,共6页
Journal of Tianjin Institute of Technology