X射线光电子能谱(XPS)中的“鬼线”

“GHOST” LINES IN X RAY PHOTOELECTRON SPECTROSCOPY

作者论述了在Ｘ射线光电子能谱（ＸＰＳ）中“鬼线”产生的机制，“鬼线”的特征及其鉴别方法；提出了在ＸＰＳ分析中减少或克服“鬼线”干扰的相应措施。

The produce mechanisms and characteristic of “ghost” lines in x ray photoelectron spectroscopy (XPS) are discussed and some methods to identify “ghost” lines are described.Measures to reduce or eliminate interference of “ghost” lines are given.It’s useful to determine present of element in XPS microanalyses.