摘要
根据功率晶体管二次击穿的物理变化过程，设计出可行的二次击穿无损测试系统。
According to the course of physical change for second breakdown of power transistor, the author designes a feasible nondestructive test system for second breakdown, and introduces the working principle of respective section of the system.
出处
《广西民族学院学报（自然科学版）》
CAS
1999年第1期15-19,共5页
Journal of Guangxi University For Nationalities(Natural Science Edition)
基金
广西科委自然科学基金
关键词
晶体管
二次击穿
无损测试
分流保护
功率晶体管
transistor
second breakdown
nondestructive test
electronic switch
divided current
safeguard remembered circuit
